The Methodology of Testability Prediction for
Sequential Circuits
徐拾义;陈斯
【期刊名称】《计算机科学技术学报：英文版》 【年(卷),期】1996(011)006
【摘要】Increasingly,test generation algorithms are being developed with the continuous creations of incredibly sophisticated computing systems.Of all the developments of testable as well as reliable designs for computing systems,the test generation for sequential circuits is usually viewed as one of the hard nuts to be solved for its complexity and time-consuming issue.Although dozens of algorithms have been proposed to cope with this issue,it still remains much to be desired in solving such problems as to determin 1) which of the existing test generation algorithms could be the most efficient for some particular circuits(by efficiency,we mean the Fault Coverage the algorithm offers,CPU time when executing,the number of test patterns to be applied,ectc.)since different algorithms would be preferable for different circuits;2)which parameters(such as the number of gates,flip-flops and loops,etc., in the circuit)will have the most or least influences on test generation so that the designers of circuits can have a global understanding during the stage of designing for testability.Testability forecastin methodology for the sequential circuits using regression
models is presented which a user usually needs for analyzing his own circuits and selecting the most suitable test generation algorithm from all possible algorithms available.Some examples and experiment results are also provided in order to show how helpful and practical the method is.
【总页数】22页(520-541)
【关键词】可测试性;时序电路;容错计算;计算机;设计 【作者】徐拾义;陈斯 【
作
者
单
位
】
ShanghaiUniversityofScienceandTechnology,Shanghai201800;ShanghaiUniversityofScienceandTechnology,Shan 【正文语种】英文 【中图分类】TP302 【文献来源】
https://www.zhangqiaokeyan.com/academic-journal-cn_journal-computer-science-technology-english_thesis/0201268365445.html 【相关文献】
1.A Complete Critical Path Algorithm for Test Generation of Combinational Circuits [J], 周权; 魏道政
2.Design and test results of a low-noise readout integrated circuit for high-energy particle detectors [J], ZHANG Mingming; CHEN Zhongjian; ZHANG Yacong; LU Wengao; JI Lijiu
3.Design and testing of a global climate prediction system based on a coupled climate model [J], MA JieHua; WANG HuiJun
4.CIRCUIT TESTABLE DESIGN AND UNIVERSAL TEST SETS FOR MULTIPLE-VALUED LOGIC FUNCTIONS [J], Pan; Zhongliang
5.Life prediction and test period optimization research based on small sample reliability test of hydraulic pumps [J], Guo Rui; Ning Chao; Zhao Jingyi; Wang Ping; Shi Yu; Zhou Jinsheng; Luo Jing
以上内容为文献基本信息，获取文献全文请下载
The Methodology of Testability Prediction for Sequential Circuits
