Detecting Extended Technicolor Effects via the Process e+e-→tt at High Energy e+e- Linear Collider

Detecting Extended Technicolor Effects via the Process e+e-→tt at High Energy e+e- Linear

Collider

YUE Chong-Xing;WAN Ling-De;SUN Jun-Feng;LU Gong-Ru

【期刊名称】《理论物理通讯（英文版）》 【年(卷),期】2001(035)001

【摘要】We calculate the corrections of extended technicolor (ETC) interactions to the asymmetry parameter ALR and the polarized parameters pLt, PtR of the process e+ e-→tt in topcolor-assisted multiscale technicolor model. Our results show that the ETC effect on PtR is negligibly small which can be safely ignored, and the ETC effect on ALR may be testable at high energy e+e- linear collider (LC). For 0.03 ≤ε≤ 0.1, 500 GeV ≤ s ≤ 800 GeV, the relative correction of PtL is in the range of 15% ≤δPtL/PtL,SM ≤ 39%, which will certainly be detected at the LC experiments (for example TESLA).`` 【总页数】4页(40-43)

【关键词】extended technicolor effects;asymmetry parameter ALR;polarized parameters PtL and PtR;high energy e+e- linear collider 【作者】YUE Chong-Xing;WAN Ling-De;SUN Jun-Feng;LU Gong-Ru 【作者单位】College of Physics and Information Engineering, Henan Normal University, Xingxiang 453002, China;College of Physics and Information Engineering, Henan Normal University, Xingxiang 453002,