SEMICONDUCTOR MEMORY TEST DEVICE AND MEHTOD OF TESTING A SEMICONDUCTOR MEMORY DEVICE
SEMICONDUCTOR MEMORY TEST DEVICE AND MEHTOD OF TESTING A SEMICONDUCTOR MEMORY
DEVICE
申请(专利)号： KR20070018470
专利号： KR100885051B1 主分类号： G11C29/10 申请权利人：
公开国代码： KR 优先权国家： KR
摘 要：
A method and an apparatus for testing a semiconductor memory device are provided to test various semiconductor memory devices using the same test
apparatus by detecting a kind of a DUT. A host interface unit(210) detects DUTs, which are connected to a memory test board through a socket. A configuration information unit(230) stores memory
configuration information for the DUTs. A configuring unit(220) reads the memory configuration information corresponding to the detected DUT and outputs test parameters required for testing the DUT(Device Under Test) based on the memory configuration information. A test unit(240) provides a test pattern to the DUT according to the test parameters, reads the test pattern stored in the test memory device according to the test parameter, and compares the read test
申请日： 2007-02-23 公开公告日： 2009-02-23
分类号： G11C29/10 发明设计人： ???;
???; ??? 申请国代码： KR
优先权： 20070223 KR
20070018470
摘 要 附 图：
pattern with the test pattern. 主权项：
??? ??? ???(DUT, Device Under Test)? ?? ? ??? ??? ???
??? ??? ??? ??? ??? ??? ???? ??? ??????;/n?? ?
权 利 要 求 说 明 书
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SEMICONDUCTOR MEMORY TEST DEVICE AND MEHTOD OF TESTING A SEMICONDUCTOR MEMORY DEVICE
